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What is Electromigration?

Latest Updated:08/01/2005

Question:

Electromigration

Answer:

This is a failure mode that has become common as semiconductor devices are using increasingly fine patterns and as their wiring current density increases.
The wiring materials (mainly aluminum) have a polycrystal structure and their metallic atoms cause mass transfer, gaining momentum through collision with electrons.
As a result, short-circuiting is caused by break faults, hillocks, or spikes.

For details, refer to the Review of Quality and Reliability Handbook.
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