The specifications of some products are customarily divided into absolute maximum ratings and electrical specifications or the absolute maximum ratings of some products are included in the electrical specifications. However, the meaning of the definition of each parameter is the same.
Absolute maximum ratings
Operating (ambient) temperature (TA, Topt)
For discrete devices, since they do not have function circuits, the storage temperature Tstg is equivalent to the operating ambient temperature.
Junction temperature (operating junction temperature: TJ, Tj) and channel temperature (Tch)
Storage temperature (Tstg)
This thermal resistance and the Junction temperature are used for calculating the power which a power semiconductor device can consume.
Thermal resistance between junction and case (θj-c) and thermal resistance between channel and case (θch-c)
Thermal resistance between junction and ambient (θj-a) and thermal resistance between channel and ambient (θch-a)
For digital ICs, in the condition that the input/output signal does not change (DC status), they are the voltage and current characteristics with respect to a high signal or low signal.
The output current is defined as a limit value at which the current flows to keep the output signal in the specified voltage range.
Leakage current is a very small amount of current that flows through the gate insulation film or channels in the off status of MOS devices.
For digital ICs, they are time characteristics of the alternating (AC) input/output signal.
Period, width, transition time, delay between signals, and setup time/hold time are defined.
The load condition and test point are conditions under which these times are defined. Generally, the test point is the output voltage and input voltage of the DC characteristics.
In an overloaded state where the load condition is exceeded, since the time constants may increase, the AC characteristics may not be satisfied, and the input side may promote degradation by a through current if it is a CMOS. If the capacitance is overloaded, degradation may be promoted unless a circuit that counters the through current is provided.
Static capacitance between the input/output pin and GND of MOS devices or between both the pins of diodes.
This is defined, along with the DC characteristics, to verify adaptability of the output to the load condition and to judge the speed of the switching operation.
Recommended operating conditions